TEM characterization of axial CdTe/ZnTe nanowires and simulation of strain induced diffusion by finite element method
نویسندگان
چکیده
1. Humboldt-Universität zu Berlin, Institut für Physik, AG Kristallographie, Newtonstraße 15, D-12489 Berlin, Germany 2. Institute of Fundamental Technological Research, Polish Akademy of Science, Swietokrzyska 21, 00-049 Warsaw, Poland 3. Polish Academy of Science, Institute of Physics, Al. Lotników 32/46, 02-668 Warsaw, Poland 4. Leibniz-Institut für Kristallzüchtung Berlin, Max-Born-Str. 2, 12489 Berlin, Germany
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